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Trace Elemental Analysis by Means of Heavy Particle-Induced X-Rays

Author:
  • Sven A E Johansson
  • Mats Ahlberg
  • Roland Akselsson
  • Mats Bohgard
  • Lars-Eric Carlsson
  • Hans-Christen Hansson
  • Gerd Johansson
  • Thomas B Johansson
  • Hans Lannefors
  • Klas Malmqvist
Publishing year: 1978
Language: English
Pages:
Publication/Series: Progress Report for IAEA, Research Agreement No. 1459/R2/CF, January 1975 - December 1977
Document type: Report
Publisher: Department of Nuclear Physics, Lund Institute of Technology

Keywords

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics
  • Particle Induced X-ray Emission Analysis
  • PIXE
  • applications of PIXE

Other

Published
thomas_b_johansson_2_sv.jpg
E-mail: thomas_b [dot] johansson [at] iiiee [dot] lu [dot] se

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The International Institute for Industrial Environmental Economics

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