Thomas B Johansson
Professor emeritus
Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis
Author
Summary, in English
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.
Department/s
- The International Institute for Industrial Environmental Economics
- Ergonomics and Aerosol Technology
Publishing year
1972
Language
English
Pages
373-387
Publication/Series
Advances in X-Ray Analysis
Volume
15
Document type
Journal article
Publisher
International Centre for Diffraction Data
Topic
- Production Engineering, Human Work Science and Ergonomics
- Subatomic Physics
Keywords
- PIXE
- particle induced x-ray emission analysis
- trace element analysis
Status
Published