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Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis

Author:
  • Thomas B Johansson
  • Roland Akselsson
  • Sven A E Johansson
Publishing year: 1972
Language: English
Pages: 373-387
Publication/Series: Advances in X-Ray Analysis
Volume: 15
Document type: Journal article
Publisher: Plenum Press

Abstract english

Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.

Keywords

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics
  • PIXE
  • particle induced x-ray emission analysis
  • trace element analysis

Other

Published
thomas_b_johansson_2_sv.jpg
E-mail: thomas_b [dot] johansson [at] iiiee [dot] lu [dot] se

Professor emeritus

The International Institute for Industrial Environmental Economics

+46 46 222 02 68

+46 73 322 57 00

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International Institute for Industrial Environmental Economics (IIIEE)

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