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X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Author:
  • Thomas B Johansson
  • Roland Akselsson
  • Sven A E Johansson
Publishing year: 1970
Language: English
Pages: 141-143
Publication/Series: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume: 84
Issue: 1
Document type: Journal article
Publisher: Elsevier

Abstract english

Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

Keywords

  • Subatomic Physics
  • Production Engineering, Human Work Science and Ergonomics
  • PIXE
  • particle induced X-ray emission analysis
  • trace element analysis

Other

Published
  • ISSN: 0167-5087
thomas_b_johansson_2_sv.jpg
E-mail: thomas_b [dot] johansson [at] iiiee [dot] lu [dot] se

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The International Institute for Industrial Environmental Economics

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