Thomas B Johansson
Professor emeritus
Analytical Use of Proton-Induced X-Ray Emission
Author
Department/s
- The International Institute for Industrial Environmental Economics
- Ergonomics and Aerosol Technology
- Nuclear physics
Publishing year
1975
Language
English
Pages
31-31
Publication/Series
Trans Am Nucl Sci; Proceedings: Summary on a lecture at the International Nuclear and Atomic Activation Conference and the 19th Annual Meeting on Analytical Chemistry in Nuclear Technology
Volume
21
Document type
Conference paper
Topic
- Production Engineering, Human Work Science and Ergonomics
- Subatomic Physics
Keywords
- PIXE
- proton-induced x-ray emission
- trace element analysis
Conference name
The Interantional Nuclear and Atomic Activation Analysis Conference
Conference date
1975-10-14 - 1975-10-16
Conference place
Gatlinburg, Tennessee, United States
Status
Published