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Thomas B Johansson

Professor emeritus

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Analytical Use of Proton-Induced X-Ray Emission

Author

  • Thomas B Johansson
  • Roland Akselsson
  • Mats Ahlberg
  • Gerd Johansson
  • Klas Malmqvist

Department/s

  • The International Institute for Industrial Environmental Economics
  • Ergonomics and Aerosol Technology
  • Nuclear physics

Publishing year

1975

Language

English

Pages

31-31

Publication/Series

Trans Am Nucl Sci; Proceedings: Summary on a lecture at the International Nuclear and Atomic Activation Conference and the 19th Annual Meeting on Analytical Chemistry in Nuclear Technology

Volume

21

Document type

Conference paper

Topic

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics

Keywords

  • PIXE
  • proton-induced x-ray emission
  • trace element analysis

Conference name

The Interantional Nuclear and Atomic Activation Analysis Conference

Conference date

1975-10-14 - 1975-10-16

Conference place

Gatlinburg, Tennessee, United States

Status

Published