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Analytical Use of Proton-Induced X-Ray Emission

Author:
  • Thomas B Johansson
  • Roland Akselsson
  • Mats Ahlberg
  • Gerd Johansson
  • Klas Malmqvist
Publishing year: 1975
Language: English
Pages: 31-31
Publication/Series: Trans Am Nucl Sci; Proceedings: Summary on a lecture at the International Nuclear and Atomic Activation Conference and the 19th Annual Meeting on Analytical Chemistry in Nuclear Technology
Volume: 21
Document type: Conference paper

Keywords

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics
  • PIXE
  • proton-induced x-ray emission
  • trace element analysis

Other

The Interantional Nuclear and Atomic Activation Analysis Conference
Published
thomas_b_johansson_2_sv.jpg
E-mail: thomas_b [dot] johansson [at] iiiee [dot] lu [dot] se

Professor emeritus

The International Institute for Industrial Environmental Economics

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International Institute for Industrial Environmental Economics (IIIEE)

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