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Thomas B Johansson

Professor emeritus

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X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Author

  • Thomas B Johansson
  • Roland Akselsson
  • Sven A E Johansson

Summary, in English

Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

Department/s

  • The International Institute for Industrial Environmental Economics
  • Ergonomics and Aerosol Technology

Publishing year

1970

Language

English

Pages

141-143

Publication/Series

Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

Volume

84

Issue

1

Document type

Journal article

Publisher

Elsevier

Topic

  • Subatomic Physics
  • Production Engineering, Human Work Science and Ergonomics

Keywords

  • PIXE
  • particle induced X-ray emission analysis
  • trace element analysis

Status

Published

ISBN/ISSN/Other

  • ISSN: 0167-5087